|
Type
|
X-Spectrum Lambda 750K, GaAs sensor
|
|---|---|
|
count rate
|
up to 750,000 cts/pixel /s |
|
angular resolution
|
setup-dependent |
|
2theta range
|
Scanning : depending on setup : -10°...80°/140°
|
|
2theta horizontal range
|
Scanning : depending on setup : -10°...60° |
|
read-out time
|
12 bit with zero time gap between images, 24 bit with 1 ms time gap between images |
|
pixel size
|
55µm x 55 µm |
|
array size
|
512x1528 |
|
field of view
|
28 x 85 mm2
|
|
degrees of freedom / translation stages
|
diffractometer |
|
typical collection time
|
0.1 ms ... 10 sec in 24 bit mode
|
|
|
in 12 bit mode up to 2000 fps |
|
Detector availability
|
available |
|
Type
|
Dectris EIGER2 X 1M-W, CdTe sensor
|
|---|---|
|
count rate
|
up to 107 cts/pixel /s |
|
angular resolution
|
setup-dependent |
|
2theta range
|
Scanning : depending on setup : -10°...80°/140°
|
|
2theta horizontal range
|
Scanning : depending on setup : -10°...60° |
|
frame rate
|
4,500 (8-bit) 2,250 (16-bit) |
|
pixel size
|
75µm x 75 µm |
|
array size
|
2068 x 512 |
|
field of view
|
155.1 x 38.4 mm2
|
|
degrees of freedom / translation stages
|
diffractometer |
|
typical collection time
|
0.1 ms ... 10 sec in 16 bit mode
|
|
|
|
|
Detector availability
|
available |
|
Type
|
Teledyne DALSA XINEOS 2329 flat panel
|
|---|---|
|
count rate
|
16 kcts/pixel
|
|
spatial resolution
|
49.5 µm
|
|
angular resolution
|
depending on setup |
|
2theta range
|
depending on setup
|
|
read-out time
|
2 frames/sec, 8 fps with 2x2 binning
|
|
pixel size
|
49.5 µm x 49.5 µm |
|
array size
|
4608 x 5890 |
|
field of view
|
228 x 291 mm2
|
|
degrees of freedom / translation stages
|
no |
|
typical collection time
|
0.2 ... 100 s
|
|
detector availability
|
available |
P23 in-situ and nanodiffraction beamline
- science at meso- and nanoscopic scales
- physics and chemistry of systems dominated by low dimensional and confinement effects
- materials and processes under non-ambient conditions
- in situ / in operando techniques
- X-ray diffraction & secondary emission
- anomalous X-ray diffraction
- XANES
Please be aware that not all the methods can be made available at the same time.
GENERAL SPECIFICATIONS
|
techniques available
|
X-ray scattering and diffraction
|
|---|---|
|
photon source
|
spectroscopic undulator, high-&beta section
|
|
period
number of periods
max power
|
31.4 mm 63
3.8 kW
|
|
source brilliance
|
10 20 ph /s / 0.1% bw / mA (max. 100mA)
|
|
polarization available
|
linear horizontal
|
|
energy range
|
5 keV – 35 keV
|
|
beamline energy resolution
|
1.3x10-4 Si(111) / 0.28x10-4 Si(311)
|
|
max flux ON SAMPLE
|
up to 8x1012 ph/s after harmonics rejection ( calculated)
|
|
spot size ON SAMPLE
|
- 1200 μm (v) x 1800 μm (h) (FWHM, unfocused, flux ~6x1012 photons @ 12 - 15keV )
- 30 μm x 160 μm ( moderate focusing, calculated flux 6x1012 photons).
- 1.6 μm x 5.2 μm. For any other focused beams sizes, please contact the beamline staff No possibility to scan the energy with focused beams so far
|
|
angle of incidence light – sample
|
0° to 90° (solid)
|
|
sample type
|
solid
|
OPTICS
|
type |
liq. N2 cooled Double Crystal Monochromator |
|---|---|
| available reflections |
Si(111) and Si(311)
|
| energy range |
5 keV - 50 keV
|
| resolving power |
E / Delta E : ~104
|
|
type |
CRL changer, optics hutch |
|---|---|
|
distance from source |
57 m
|
| type of lenses |
Beryllium 2D
|
| energy range |
5 keV - 35 keV
|
| usage |
- moderate 2:1 focusing
- collimation - pre-focusing and aperture matching
|
|
type |
Mirror system |
|---|---|
|
deflection plane |
horizontal
|
|
angle of incidence |
curved surface, collimating: 3 mrad flat surface, harmonics rejection: 2-5 mrad |
|
surface coatings |
B4C, Pt, Rh
|
|
type |
CRL changer, experimental hutch |
|---|---|
|
distance from source |
85 - 87 m |
|
type of lenses
|
Beryllium 2D
|
| energy range |
5 keV - 40 keV
|
|
usage
|
micro & nano focussing
|
ENDSTATION
|
Diffractometer
|
5+2-Cirlce HUBER operation modes: - closed/opened Eulerian cradle - heavy load in horizontal scattering mode
|
|---|---|
| Manipulator |
Eulerian cradle (15 kg max payload):
xy : +/- 15 mm travel ; z : +/- 10 mm travel
distance to pivot point: 140 mm
heavy load mode (150 kg max load):
horizontal rotation stage on a rotation segment
hexapod for sample cell manipulation
|
| Sample environment |
optional : Janis ST-500 He flow cryostat
optional : Lakeshore 340 temperature controller
optional : Anton Paar vacuum oven
optional: in-situ PLD growth chamber ( use by arrangement with the beamline staff)
optional : user defined equipment
|
DETECTOR(S)
|
Transmission
|
yes
|
|---|---|
|
Refraction
|
yes
|
|
Fluorescence
|
yes
|
|
Total electron yield
|
no
|
|
Grazing incidence angle
|
yes
|
|
Optical luminescence |
yes |
|
Type
|
APD, NaI
|
|---|---|
|
energy resolution
|
~ 50%
|
|
count rate
|
107 cts/s (APD) ; 5x104 cts/s (NaI)
|
|
angular resolution
|
|
|
2theta range
|
Scanning : Depending on setup -10° ... 80° / 140°
|
|
2theta horizontal range
|
Scanning : Depending on setup -10° ... 60°
|
|
typical collection time
|
1 ms ... 10 s
|
|
Type
|
Amptec
|
|---|---|
|
energy resolution
|
100 eV |
|
count rate
|
2x105 cts/s
|
|
2theta range
|
fixed or detector arm
|
|
typical collection time
|
1 s
|
|
Type
|
X-Spectrum Lambda 750K, GaAs sensor
|
|---|---|
|
count rate
|
up to 2.5x108 cts/mm2 /s |
|
spatial resolution
|
55 µm
|
|
angular resolution
|
setup-dependent |
|
2theta range
|
Scanning : depending on setup : -10°...80°/140°
|
|
2theta horizontal range
|
Scanning : depending on setup : -10°...60° |
|
read-out time
|
12 bit with zero time gap between images, 24 bit with 1 ms time gap between images |
|
pixel size
|
55µm x 55 µm |
|
array size
|
512x1528 |
|
field of view
|
28 x 85 mm2
|
|
degrees of freedom / translation stages
|
diffractometer |
|
typical collection time
|
0.1 ms ... 10 sec in 24 bit mode
|
|
|
in 12 bit mode up to 2000 fps |
|
Detector availability
|
available |
|
Type
|
X-Spectrum Lambda 750K, GaAs sensor
|
|---|---|
|
count rate
|
up to 2.5x108 cts/mm2 /s |
|
spatial resolution
|
55 µm
|
|
angular resolution
|
setup-dependent |
|
2theta range
|
Scanning : depending on setup : -10°...80°/140°
|
|
2theta horizontal range
|
Scanning : depending on setup : -10°...60° |
|
read-out time
|
12 bit with zero time gap between images, 24 bit with 1 ms time gap between images |
|
pixel size
|
55µm x 55 µm |
|
array size
|
512x1528 |
|
field of view
|
28 x 85 mm2
|
|
degrees of freedom / translation stages
|
diffractometer |
|
typical collection time
|
0.1 ms ... 10 sec in 24 bit mode
|
|
|
in 12 bit mode up to 2000 fps |
|
Detector availability
|
available |
|
Type
|
Teledyne DALSA XINEOS 2329 flat panel
|
|---|---|
|
count rate
|
16 kcts/pixel
|
|
spatial resolution
|
49.5 µm
|
|
angular resolution
|
depending on setup |
|
2theta range
|
depending on setup
|
|
read-out time
|
2 frames/sec, 8 fps with 2x2 binning
|
|
pixel size
|
49.5 µm x 49.5 µm |
|
array size
|
4608 x 5890 |
|
field of view
|
228 x 291 mm2
|
|
degrees of freedom / translation stages
|
no |
|
typical collection time
|
0.2 ... 100 s
|
|
detector availability
|
available |
|
Type
|
Teledyne DALSA XINEOS 2329 flat panel
|
|---|---|
|
count rate
|
16 kcts/pixel
|
|
spatial resolution
|
49.5 µm
|
|
angular resolution
|
depending on setup |
|
2theta range
|
depending on setup
|
|
read-out time
|
2 frames/sec, 8 fps with 2x2 binning
|
|
pixel size
|
49.5 µm x 49.5 µm |
|
array size
|
4608 x 5890 |
|
field of view
|
228 x 291 mm2
|
|
degrees of freedom / translation stages
|
no |
|
typical collection time
|
0.2 ... 100 s
|
|
detector availability
|
available |
CONTROL/DATA ANALYSIS
|
Software type
|
SPOCK, Tango
|
|---|---|
|
Data output type
|
ascii, cbf, tif, Online format fio |
|
Data output
|
ascii, NEXUS
|
|
Software(s) for quantitative analysis
|
Python based scripts |
SUPPORT LAB
On request support labs are available for mechnical and electronic work.
