P07 - High Energy Materials Science Beamline
The HEMS beamline at PETRA III satisfies high energy x-ray diffraction (XRD) and imaging techniques: it is tunable in the range 30-200 keV and optimized for micro- meter focusing with compound refractive lenses (CRLs). In-house and development activities are shared between HZG and DESY, where HZG is focussing on engineering materials science applications with two hutches and DESY operates one hutch for hard XRD experiments.
HEMS has partly been operational since summer 2010. Regular user operation started June 2011, the last dedicated instrumentation (3D-XRD grain mapping) has been commissioned end of 2013.
CONTACT |
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GENERAL SPECIFICATIONS
techniques available |
XRD, PDF, SAXS, 3D-XRD, Tomography |
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photon source |
in-vacuum undulator IVU-21 |
period number of periods max power |
21.2 mm
188 5.2 kW |
source brilliance |
1018 ph / s / 0.1% bw / mA |
polarization available |
linear horizontal |
energy range |
50 keV – 200 keV |
beamline energy resolution |
5 - 250 eV at 80 keV |
max flux ON SAMPLE |
5 x 1012 ph /s at 100 keV |
spot size ON SAMPLE |
1 mm x 1 mm down to 2 μm (v) x 30 μm (h) with Al CRLs
0.9 (v) x 6 (h) mm for 3D-XRD for low-beta mode
|
angle of incidence light – sample |
0 to 90o, 3.5 A-1(solid, liquid in EH2) 0 to 15o (EH3), 0 for 3D-XRD and Tomography |
sample type |
solid or liquid, thin films |
OPTICS
type |
water cooled DCM in horizontal Laue scattering geometry |
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reflections |
Si(111) bent in Rowland geometry |
energy range |
50 - 200 keV |
resolving power |
1 x 10-3 down to 7 x 10-5 (channel-cut) |
ENDSTATIONS
Diffractometer in EH2 |
HUBER General Purpose Diffractometer with theta swing tilt for the investigation of surfaces and interfaces Z-, XY-, Rx-Ry-tilt-stages, Phi rotation Lin. translation sample stack & optional closed Eulerian cradle HUBER 512.1 |
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Manipulator in EH2 |
Z-stage: +/- 10 mm, 200 kg load XY-stage: +/- 25 mm
Rx-Ry-stage and theta swing tilt: +/- 5o
Phi rotation: +/- 180o sample stack: +/- 30 mm |
Heavy Load Hexapod in EH3 |
PI Hexapod with load capacity 1 t and 1 μm resolution
ranges: x: + 202 / - 237 mm; y: +/- 204 mm; z: +/- 100 mm u-Rx, v-Ry: +/- 20o; w-Rz: +/- 5o; separate w-Rz rotation table: +/- 180o |
Dedicated Instruments in EH4 |
3D-XRD with CRLs focusing, 1 μm resolution, load up to 20 kg
Tomography with 1 μm focus (based on absorption and phase contrast) |
Sample Environments |
Tensile & compressive stress rigs (miniature, for texture, INSTRON 100 kN)
10-350 K closed cycle displex cryostat with 360o beam accesss mounted in an Eulerian cradle
6.5-450 K displex cryostat, full access mini furnace <1300 K mountable in an Eulerian cradle multi-purpose high temperature application up to ~1600 K in EH2 Modified Dilatometer Bähr DIL 805 A/D with tensile/compressive stress units and rates of 4000 K/s heating and 2500 K/s cooling in EH3 |
DETECTORS
Transmission |
yes |
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Reflection |
yes |
Fluorescence |
yes |
Total electron yield |
no |
Grazing incidence angle |
yes |
Type |
MAR345 Image Plate Detector |
---|---|
energy resolution |
none |
count rate |
65 kcts/pixel |
spatial resolution |
100 µm |
angular resolution |
depending on setup |
2theta range |
depending on setup |
read-out time |
2-2.5 min |
pixel size |
100 µm x 100 µm |
array size |
3450 x 3450 (active area circular) |
field of view |
(345/2) x (345/2) x PI mm2 |
degrees of freedom / translation stages |
5 on detector portal (EH3) |
typical collection time |
1-40 s |
Type |
Perkin Elmer XRD 1621 Flat Panel |
---|---|
energy resolution |
none |
count rate |
65 kcts/pixel |
spatial resolution |
200 µm |
angular resolution |
depending on setup |
2theta range |
depending on setup |
read-out time |
66 msec |
pixel size |
200 µm x 200 µm |
array size |
2048 x 2048 |
field of view |
410 x 410 mm2 |
degrees of freedom / translation stages |
5 on detector portal (EH3), rail (EH2) |
typical collection time |
0.1-8 s |
Type |
PILATUS3 X CdTe 2M |
---|---|
energy resolution |
none |
count rate |
5 x 10E6 cts/s/pixel |
spatial resolution |
172 µm |
angular resolution |
depending on setup |
2theta range |
depending on setup |
read-out time |
0.95 msec |
pixel size |
172 µm x 172 µm |
array size |
1475 x 1679 |
field of view |
253.7 x 288.8 mm2 |
degrees of freedom / translation stages |
5 on detector portal (EH3) |
typical collection time |
4-20 msec |
Type |
Photonic Science VHR 11 CCD |
---|---|
energy resolution |
none |
count rate |
65 kcts/pixel |
spatial resolution |
32 µm |
angular resolution |
depending on setup |
2theta range |
depending on setup |
read-out time |
200 msec |
pixel size |
4.5 µm x 4.5 µm |
array size |
4008 x 2672 |
field of view |
18 x 12 mm2 |
degrees of freedom / translation stages |
5 on detector portal (EH3) |
typical collection time |
0.5-4 s |
Type |
Oxford Cyberstar NaI |
---|---|
energy resolution |
< 20% |
count rate |
5 x 105 / sec |
angular resolution |
depending on slits |
2theta range |
-10o to 35o (hor), -1o to 5o (ver) |
field of view |
maximum 30 mm diameter |
degrees of freedom / translation stages |
5 on detector rail (EH2) |
typical collection time |
0.1-20 s |
Type |
Amptek CdTe-Diode |
---|---|
energy resolution |
< 2% |
count rate |
5 x 104 |
angular resolution |
determined by slits |
2theta range |
-10o to 35o (hor), -1o to 5o (ver) |
field of view |
maximum 5 x 5 mm2 |
degrees of freedom / translation stages |
5 on detector rail (EH2) |
typical collection time |
0.1-20 s |
other facilities available:
in-situ friction stir welding apparatus FlexiStir (in-house EH3)
in-situ laser beam welding chamber FlexiLas (in-house EH3, EH1)
in-situ sputter deposition chamber (in collaboration with Linköping University, EH3)
in-situ directional zone melting induction furnace (in collaboration with KIT, EH3)
CONTROL/DATA ANALYSIS
Software type |
Labview, C++, etc. |
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Data output type |
spectra, images, parameters like temperature and pressure, etc. |
Data output |
ASCII, TIF, MAR |
Software(s) for quantitative analysis |
commercial / in-house / public domain examples: fit2D, image viewer, a2tool, MARViewer, fable, ... |
SUPPORT LAB
On request and after introduction via technical staff two nearby support laboratories for mechanical and electronic work are available.