Unified Data Sheet

P06 - Micro and Nano-Probe Beamline

GENERAL SPECIFICATIONS

techniques available

micro-XRF, micro-XRD, micro-XAS

photon source

undulator

period

number of periods

max power

31.4 mm;

  60

3.8 kW

source brilliance 

1019 ph / s / 0.1% bw / mA

polarization available

linear horizontal

energy range 

  5 – 45 keV 

beamline energy resolution

1.4 x10-4 dE/E for Si (111)

max flux ON SAMPLE

2x10^10ph/s in KB mirror focus

spot size ON SAMPLE 

 80nm x80nm (Nanohutch, NFL, 10-25keV)
350nm x350nm (Microhutch, KB mirrors, 5-23keV)
500nm x 1500nm (Microhutch, CRL, 10-50keV)

angle of incidence light – sample 

0 to 90

sample type

solid or liquid

Beamsize and flux at sample:

Nanoprobe:

80 x 80 nm2 some 107 ph/s (Nano Focusing lenses (NFL) 10-25 keV)

Microprobe:

350 x 350 nm2 some 1010 ph/s (KB mirrors, 5-23 keV)

500 x 1500 nm2 1010 ph/s (compound refractive lenses (CRL), 15-35keV)

Source properties

Source size:

36 x 6 µm2 σ (@12keV)

Source divergence:

28 x 4 µrad2 σ (@12keV)

Transverse coherence length:

ξh ~87mm, ξv ~567mm (@ 100 m and 12keV)

Linear polarization:

99.98 %

Insertion device:

2m Spectroscopy undulator U32, Period length = 31.4 mm, Minimum gap 9.5 mm, first harmonic 2.4 keV


OPTICS

type

  cryo cooled double crystal monochromator (DCM) and cryo cooled channel-cut monochromator (CC)
grating properties 

 Si (111) (DCM and CC)
energy range         

Si111 DCM 2.4-50keV, Si111 CC 6-20 keV
resolving power 

Si:1.4x10-4 dE/E

Double-crystal Monochromator (Oxford High-heatload DCM)

Crystals:

Si(111) pair and Channel-cut

Energy range:

2.4 – 50 keV (DCM), 6 -20 keV (CC)

Double plane mirrors (Zeiss)

for higher harmonics rejection, optional

Coating:

Cr, Si, Pt

Energy range:

4-42 keV

Due to diamond windows and ambient sample environment the lowest feasible beam energy is currently limited to 6 keV.

 

ENDSTATION(S)

Sample positioning

Diffractometer

n.a.
Manipulator 

x,y,z stages and 1 rotation
Sample environment  atmosphere


Sample environment

pressure range

               none

temperature range

              none

humidity range

              none


Detection modes

Transmission 

            yes 

Reflection   

           yes    

Fluorescence           

           yes

Total electron yield

              No

Grazing incidence angle    

              n.a.


Detector(s)

Type 

  Vortex  PCO edge   Eiger 4M

energy resolution 

  140eV FWHM
   none  none

count rate 

  1Mcps
  5x10^8 ph/s/mm^2

spatial resolution 

  n.a.   1µm   75 µm

angular resolution  

   n.a.   n.a.  

2theta range  

   n.a.    

read-out time 

   0.25µs  5ms   4 µs

pixel size         

   n.a.   6.5 µm   75 µm

array size 

   n.a.   2048 × 2048 pixel
 2070x2167 pixel

field of view  

   50mm2   x10: 1.3mm x 1.3mm
  x25:0.53mm x 0.53mm
  x50:0.26mm x 0.26mm
 155 x 162 mm^2

 degrees of freedom / translation stages

  4/ yes
   yes 3/ yes 

cradles

   n.a.   n.a.   n.a.

  typical collection time

   0.003-5 s   <0.1 s   0.002 - 2 s


spectrometer(s) / microscope(s)

Imaging mode  

scanning mode

type

transmission, fluorescence, absorption, diffraction, diffractive imaging, 2D and 3D

energy resolution

   XRF: 140eV (FWHM), XAS: 1.4 - 4 eV dE/E

lateral resolution

   Nanoprobe: 80x80nm NFL (10-25 keV)
  Microprobe: 350x350nm KB Mirror (5-23keV), 500x1500nm CRL (15-35keV)

field of view

 range 1µm-10mm

 

other facilities available: LEED, control atmosphere, mass analyzer, in-situ devices etc.

 

CONTROL/DATA ANALYSIS

Software type

Online, TANGO, python, perl

Data output type

spectra, images

Data output

ascii, h5

Software(s) for quantitative analysis

AXIL, PyMCA

 

SUPPORT LAB

Sample preparation with optical microscopes.