Unified Data Sheet

P23 in-situ and nanodiffraction beamline

 

  • science at meso- and nanoscopic scales
  • physics and chemistry of systems dominated by low dimensional and confinement effects
  • materials and processes under non-ambient conditions
  • in situ / in operando techniques

  • X-ray diffraction & secondary emission
  • anomalous X-ray diffraction
  • XANES

Please be aware that not all the methods can be made available at the same time.


GENERAL SPECIFICATIONS

techniques available
 X-ray scattering and diffraction
photon source
spectroscopic undulator, high-&beta section
period
number of periods
max power
31.4 mm
63
3.8 kW
source brilliance 
10 20 ph /s / 0.1% bw / mA    (max. 100mA)
polarization available
linear horizontal
energy range 
5 keV – 35 keV 
beamline energy resolution
1.3x10-4 Si(111) / 0.28x10-4 Si(311)
max flux ON SAMPLE
up to 8x1012 ph/s after harmonics rejection ( calculated)
spot size ON SAMPLE 
- 1200 μm (v) x 1800 μm (h) (FWHM,  unfocused,  flux ~6x1012 photons @ 12 - 15keV )
- 30 μm x 160 μm ( moderate focusing, calculated flux 6x1012 photons).
- 1.6 μm x 5.2 μm.

For any other focused beams sizes, please contact the beamline staff

No possibility to scan the energy with focused beams so far

 

angle of incidence light – sample 
to 9 (solid)
sample type
solid

 

OPTICS

type

liq. N2 cooled Double Crystal Monochromator

available reflections
Si(111)  and  Si(311)
energy range         
5 keV - 50 keV
resolving power 
E / Delta E : ~104

type

CRL changer, optics hutch

distance from source
57 m
type of lenses        
Beryllium 2D
energy range         
5 keV - 35 keV
usage         
  - moderate 2:1 focusing
  - collimation
  - pre-focusing and aperture matching

type

Mirror system

deflection plane

horizontal

angle of incidence    

curved surface, collimating: 3 mrad

flat surface, harmonics rejection: 2-5 mrad

surface coatings

B4C, Pt, Rh

type

CRL changer, experimental hutch

distance from source

85 - 87 m

type of lenses        
Beryllium 2D
energy range
5 keV - 40 keV
usage         
micro & nano focussing

 

ENDSTATION

Diffractometer
Diffractometer
5+2-Cirlce HUBER
operation modes:
- closed/opened Eulerian cradle
- heavy load in horizontal scattering mode
Manipulator 
Eulerian cradle (15 kg max payload):
      xy : +/- 15 mm travel ;  z : +/- 10 mm travel
     distance to pivot point: 140 mm
    
heavy load mode (150 kg max load):
      horizontal rotation stage on a rotation segment 
      hexapod for sample cell manipulation
Sample environment 
optional : Janis ST-500 He flow cryostat
optional : Lakeshore 340 temperature controller
optional : Anton Paar vacuum oven
optional: in-situ PLD growth chamber ( in development, prototype successfully tested )
optional : user defined equipment

DETECTOR(S)

Detection modes
Transmission 
        yes       
Refraction   
        yes  
Fluorescence           
        yes 
Total electron yield
        no 
Grazing incidence angle    
       yes
Optical luminescence  
yes


Point Detector(s)
Type 
 APD, NaI
energy resolution 
~ 50%
count rate 
107 cts/s (APD)  ;   5x104 cts/s (NaI) 
angular resolution  
 
2theta range  
Scanning : Depending on setup -10° ... 80° / 140°
2theta horizontal range
Scanning : Depending on setup -10° ...  60°
  typical collection time
1 ms ...  10 s
Point Detector(s)
Type 
Amptec
energy resolution 
100 eV
count rate 
2x105 cts/s 
2theta range  
fixed or detector arm
  typical collection time
1 s
Area Detector(s)
Type 
X-Spectrum Lambda 750K, GaAs sensor
count rate 
up to 2.5x108 cts/mm2 /s
spatial resolution 
55 µm
angular resolution  
setup-dependent
2theta range  
Scanning : depending on setup : -10°...80°/140°
  2theta horizontal range
Scanning : depending on setup : -10°...60°
read-out time 
12 bit with zero time gap between images, 24 bit with 1 ms time gap between images
      pixel size         
 55µm x 55 µm
array size 
512x1528
field of view  
28 x 85 mm2
 degrees of freedom / translation stages
diffractometer
  typical collection time
0.1 ms ... 10 sec in 24 bit mode

in 12 bit mode up to 2000 fps

Detector availability

available

Area Detector(s)
Type 
Teledyne DALSA  XINEOS 2329 flat panel
count rate 
16 kcts/pixel
spatial resolution 
49.5 µm
angular resolution  
depending on setup
2theta range  
depending on setup
read-out time 
2 frames/sec, 8 fps with 2x2 binning
      pixel size         
 49.5 µm x 49.5 µm
array size 
 4608 x 5890
field of view  
228 x 291 mm2
 degrees of freedom / translation stages
no
  typical collection time
0.2 ... 100 s
detector availability

 available

 

CONTROL/DATA ANALYSIS

Software type
SPOCK, Tango
Data output type
ascii, cbf, tif, Online format fio
Data output
ascii, NEXUS
Software(s) for quantitative analysis
Python based scripts

 

SUPPORT LAB

On request  support labs are available for mechnical and electronic work.