P22 - Hard X-ray Photoelectron Spectroscopy
P22 is designed for X-ray photoelectron spectrospopy techniques and applications making use of the high source brilliance in the photon energy 2.4 - 15 keV.
| CONTACT | 
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| General Specifications | |
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| Techniques available | 
	HAXPES | 
| Photon source | 2m spectroscopy undulator | 
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	Period | 
	32.8 mm | 
| Source brilliance | 10 18 ph /s / 0.1% bw / 100 mA | 
| Polarisation | linear horizontal | 
| Photon Energy range | 2.4 keV - 30 keV | 
| Beamline energy resolution | deltaE/E = 1.4 x 10-4 resp. 0.6 x 10-4 | 
| Max flux on sample | 2x1013 ph/s at 6 keV (Si (111) bandpass) | 
| Minimum spot size on sample | 10 x 10 um2 | 
| Sample type | preferrably conducting | 
| Optics | |
| Primary monochromator | |
| Type | LN2 cooled Double Crystal | 
| Energy range | 2.4 - 30 keV | 
| Resolving power | 
	ΔE/E : 1.3x10-4 - 0.28x10-4 | 
| Available reflections | Si(111), Si(311) | 
| Secondary monochromator | |
| Type | Double channel-cut (+ - - +) | 
| Energy range | 2.4 - 15 keV | 
| Resolving power | ΔE/E : 10-4 - 5x10-6 | 
| Available reflections | Si(333), Si(444), Si(220) | 
| Phase retarder | |
| Type | 
	single stage | 
| Energy range | 4 - 10 keV | 
| Mirror 1 | |
| Shape | Cylinder, deflecting horizontal | 
| Coatings | B4C / Palladium | 
| Energy Range | 
	2.4-11 keV (B4C) | 
| Usage | Vertical focusing | 
| Mirror 2 | |
| Shape | Plane, deflecting horizontal | 
| Coatings | B4C / Palladium | 
| Energy range | 
	2.4-11 keV (B4C) | 
| Usage | Beam deflection | 
| Mirror 3 | |
| Shape | Plane elliptical (mirror bender) | 
| Coatings | B4C / Palladium | 
| Energy range | 
	2.4-11 keV (B4C) | 
| Usage | Horizontal focusing | 
 
						 
						 
							 
					 
					