January 22nd – 23rd 2008 at HASYLAB/DESY building 25b, seminar room 109
January 22nd
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9:00 session introduction to PETRA III:
Hermann Franz: Introduction to PETRA III -
9:30 brief outline of beamline concept and bounding conditions:
Gerald Falkenberg: Beamline concept
Horst Schulte-Schrepping: Cryo-Cooled High-Heatload Monochromator for Petra III - 10:45-11:15 coffee break
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11:15 Session on third generation SR applications I:
Koen Janssens: Analysing materials at different length scales
Frank Brenker: Non-destructive 3-dimensional synchroton-XRF trace element measurements of down to the nanoscale
Walter Schröder: Probing biomedical tissues - a challenge for analysis and sample preparation - 12:45 – 14:15 lunch break (DESY canteen)
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14:15 Session on third generation SR applications II:
Joachim Mayer: Microscopy and Spectroscopy with Electrons: Current State of the Art and possible links to the X-ray Nanoprobe
Max Wilke: Spatially resolved XRF and XAFS investigations of Earth materials
Melissa Denecke: Spatially resolved investigations related to nuclear waste disposal - 15:45 coffee break
- 16:15 Discussion about suitable characteristics of a micro/nanoprobe beamline
- 18:30 Short visit of the PETRA III hall (if weather allows to pass the construction road)
- 20:00 Dinner at the Brazilian restaurant “Panthera Rodizio” , Ditmar-Koel-Str.3
January 23rd
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9:00 session on beamline technology I:
Manfred Burghammer: Instrumentation for X-Ray Nano-Diffraction Experiments: Experience and Concepts at the ESRF Microfocus Beamline
Daniel Grolimund: microXAS Beamline Project: Beauty or Beast?
Jörg Maser: X-ray Microscopy at the Nanoscale: Optics, Instrumentation and Applications - 10:30-11:00 coffee break
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11:00 session on beamline technology II:
Tim Salditt: Hard x-ray imaging of biomaterials and cells:fluorescence, diffraction and phase contrast
Christian David: Diffractive x-ray optics for the Micro/Nano-Probe at Petra III
Raphael Richaud (IRELEC): KB system for micro-focusing
Michael Feser (XRADIA): Turnkey micro- and nanofocusing optics and microscope systems - 13:00 lunch
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14:30 Session on beamline concept including discussion
Gerald Falkenberg, Christian Schroer < - 17:00 end of workshop
