P65 - EXAFS Beamline
P65 is dedicated to the majority of EXAFS experiments which do not require extremely high brilliance, photon flux or beamsizes below 1 mm2. This includes most operando experiments on catalysts, material sciences and geo- and environmental chemistry. The energy range covers 4 keV - 44 keV.
CONTACT |
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GENERAL SPECIFICATIONS
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EXAFS, XANES |
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11 periods undulator |
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32.8 mm 11 |
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5x10 16 ph /s / 0.1% bw / mA (max. 100mA) |
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linear horizontal |
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4 keV - 44 keV |
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deltaE/E = 1.4 x 10-4 resp. 0.6 x 10-4 |
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2x1012 ph/s at 8.9 keV (calculated, tuned undulator) |
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0.5 x 1 mm2 |
|
any |
OPTICS
Type |
Water cooled Double Crystal Monochromator |
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Energy range |
4 keV - 44 keV |
Resolving power |
E/ΔE : 1x104 - 2x104
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Available reflections |
Si111 and Si311 |
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|
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Coating |
Silicon |
Energy Range |
4-44 keV |
Usage |
Harmonic rejection (4 keV - 44 keV) |
ENDSTATION
Experimental Table |
Breadboard with X95 rail |
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Beam height over rail |
28cm |
Sample environment |
Vacuum sample cross with standard motorised sample holder for up to 20 samples |
DETECTOR(S)
Transmission
|
yes |
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Refraction
|
no |
Fluorescence
|
yes |
Total electron yield
|
no |
Grazing incidence angle
|
yes |
Type |
Ion Chambers |
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energy resolution
|
none
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count rate
|
linear up to 1012 s-1 |
Beam Size |
given by slits |
Typical collection time |
30 s - 300 s per EXAFS scan |
Type |
Hitachi ME4 SDD
|
---|---|
Energy resolution |
200 eV at 5.6keV |
Count rate |
2 * 105 s-1 per element |
2θ range  |
fixed at 90° |
Typical collection time per point |
0.1 s - 5 s |
CONTROL/DATA ANALYSIS
Software type
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Sardana, Tango |
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Data output type
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Spectra, parameters such as temp., press, etc. |
Data output |
ASCII, HDF5/NEXUS |
Software(s) for quantitative analysis
|
Larch, Demeter, FEFF |
SUPPORT LAB
A sample preparation lab equipped with a fume hood and a glove box is adjacent to the control hutch. An analytical balance and a hydraulic pellet press is available inside and outside the glove box.