P24 - Chemical Crystallography
P24 is dedicated to crystallographic studies in fields like physics, chemistry, biology, earth and material sciences. The beamline provides monochromatic X-ray beam in a range from 8 KeV until 44 KeV. Typical applications: classical crystal structure, diffuse scattering, charge density analysis, phase transitions, disordered and modulated structures at different sample environments (temperature, pressure, electric and magnetic fields etc). It consists of one control room, two experimental hutches and a preparation laboratory equipped with a fume hood to handle toxic solvents. P24 provides powerful instrumentation for new applications and to continue the activities of the former experimental stations D3, F1 and B2 from DORIS III, shutdown on 2012 ...... .
GENERAL SPECIFICATIONS
| techniques available |
X ray Chemical Crystallography |
|---|---|
|
photon source
|
U29 PETRA III undulator (2meters)
|
|
period
number of periods
max power
|
29 mm |
|
source brilliance
|
10 18 ph /s / 0.1% bw / mA (max. 100mA)
|
|
polarization available
|
linear horizontal
|
|
energy range
|
8 keV, 17KeV - 44 keV |
|
beamline energy resolution
|
ΔE/E = 1.4 x 10-4 resp. 0.6 x 10-4 |
|
max flux ON SAMPLE
|
5x1011 ph/s at 8 keV 1012 ph/s at 22 keV |
|
spot size ON SAMPLE
|
400 μm x 400 μm |
|
sample type
|
single crystals |
OPTICS
|
type |
Water cooled Double Crystal Monochromator |
|---|---|
| available reflections |
Si111 and Si311
|
| energy range |
8 keV: 17 - 44 keV
|
| resolving power |
E/ ΔE : 1x104 ... 2x104 |
ENDSTATIONS (P24.2 and P24.3)
|
Diffractometer |
Four circle kappa diffractometer |
|---|---|
|
Beam height over rail |
1422 mm |
| Sample environment |
Gas jet cryostat |
|
Diffractometer |
Four circle diffractometer with Euler cradle |
|---|---|
|
Beam height over rail |
1422 mm |
| Sample environment |
Gas jet cryostat or closed cycle displex cryostat |
|
Beam height |
1422 mm |
|---|---|
|
Sample |
Vacuum |
DETECTORS
|
Diffraction
|
yes |
|---|---|
|
Fluorescence
|
yes |
|
Transmission
|
no |
|
Refraction
|
no |
|
Grazing incidence angle
|
no |
|
Type
|
Amptek Silicon Drift SDD
|
|---|---|
|
energy resolution
|
125 – 135 eV FWHM at 5.9 keV |
|
count rate
|
105 Hz |
|
Type
|
Cyberstar 48mm body, 30mm aperture, 5mm LaCl3 scintillator, Be window
|
|---|---|
|
energy resolution
|
25 % at 22 KeV |
|
count rate
|
2.5 Mcps |
|
Type
|
MARCCD 165
|
Pilatus CdTe 1M |
|---|---|---|
|
typical collection time
|
>0.1 s |
> 3ms |
CONTROL/DATA ANALYSIS
|
Software type
|
spec |
|---|---|
|
Data output type
|
diffraction data |
|
Data output
|
ASCII,TIFF,CBF |
|
Software(s) for quantitative analysis
|
Eval15 combinecbf RESY XDS |
Sample preparation lab
A sample preparation lab with fume hood is adjacent to the control hutch.
