Unified Data Sheet

P22 - Hard X-ray Photoelectron Spectroscopy

P22 is designed for X-ray photoelectron spectrospopy techniques and applications making use of the high source brilliance in the photon energy 2.4 - 15 keV.

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General Specifications

 

Techniques available

HAXPES
HAXPEEM
Ambient pressure HAXPES
k-Microscopy

Photon source

2m spectroscopy undulator

Period
Number of periods
Max total power

32.8 mm
58
3.5 kW

Source brilliance

10 18 ph /s / 0.1% bw / 100 mA

Polarisation

linear horizontal

Photon Energy range

2.4 keV - 30 keV

Beamline energy resolution

deltaE/E = 1.4 x 10-4 resp. 0.6 x 10-4

Max flux on sample

2x1013 ph/s at 6 keV (Si (111) bandpass)

Minimum spot size on sample

10 x 10 um2

Sample type

preferrably conducting


 

Optics

 

Primary monochromator

 

Type

LN2 cooled Double Crystal

Energy range

2.4 - 30 keV

Resolving power

ΔE/E : 1.3x10-4 - 0.28x10-4

Available reflections

Si(111), Si(311)

Secondary monochromator

 

Type

Double channel-cut (+ - - +)

Energy range

2.4 - 15 keV

Resolving power

ΔE/E : 10-4 - 5x10-6

Available reflections

Si(333), Si(444), Si(220)

Phase retarder

 

Type

single stage
single crystal diamond

Energy range

4 - 10 keV

Mirror 1

 

Shape

Cylinder, deflecting horizontal

Coatings

B4C / Palladium

Energy Range

2.4-11 keV (B4C)
5-20 keV (Pd)

Usage

Vertical focusing

Mirror 2

 

Shape

Plane, deflecting horizontal

Coatings

B4C / Palladium

Energy range

2.4-11 keV (B4C)
5-20 keV (Pd)

Usage

Beam deflection

Mirror 3

 

Shape

Plane elliptical (mirror bender)

Coatings

B4C / Palladium

Energy range

2.4-11 keV (B4C)
5-20 keV (Pd)

Usage

Horizontal focusing