PHOTON SCIENCE

Publications based on data obtained at P22 are requested to include the following acknowledgement:
"We acknowledge DESY (Hamburg, Germany), a member of the Helmholtz Association HGF, for the provision of experimental facilities. Parts of this research were carried out at PETRA III using beamline P22 and we would like to thank XXX for their assistance in using XXX. Beamtime was allocated for proposal(s) (Beamtime IDs e.g. I-2020xxxx)."

If applicable, also acknowledge travel reimbursement. If granted via CALIPSOplus please include the following sentence:
"The research leading to this result has been supported by the project CALIPSOplus under the Grant Agreement 730872 from the EU Framework Programme for Research and Innovation HORIZON 2020"

For HAXPES hemishpere and Momentum Microscope please additionally add the following sentence:
“Funding for the (HAXPES/k-microscope) instrument by the Federal Ministry of Education and Research (BMBF) under framework program ErUM is gratefully acknowledged.”

Please refer also to the DESY user guide.

Please reference the following paper in any publication based on data obtained at P22:
The new dedicated HAXPES beamline P22 at PETRAIII
Schlueter, C. ; Gloskovskii, A. ; Ederer, K. ; Schostak, I. ; Piec, S. ; Sarkar, I. ; Matveyev, Y. ; Lömker, P. ; Sing, M. ; Claessen, R. ; Wiemann, C. ; Schneider, C. M. ; Medjanik, K. ; Schönhense, G. ; Amann, P. ; Nilsson, A. ; Drube, W.
13th International Conference on Synchrotron Radiation Instrumentation, SRI2018, Taipei, Taiwan, AIP conference proceedings 2054(1), 040010 (2019)
[10.1063/1.5084611]

For the use of the POLARIS endstation please additionally reference:
A high-pressure x-ray photoelectron spectroscopy instrument for studies of industrially relevant catalytic reactions at pressures of several bars.
Amann, P.; Degerman, D.; Lee, M.-T.; Alexander, J.D.; Shipilin, M.; Wang, H.-Y.; Cavalca, F.; Weston, M.; Gladh, J.; Blom, M.; Björkhage, M.; Löfgren, P.; Schlueter, C.; Loemker, P.; Ederer, K.; Drube, W.; Noei, H.; Zehetner, J.; Wentzel, H.; Åhlund, J.; Nilsson, A.
Review of Scientific Instruments 90, no. 10, 103102 (2019).
[10.1063/1.5109321]

For the HAXPEEM Instrument please additionally reference to:
Bulk Sensitive Hard X-Ray Photoemission Electron Microscopy
Patt, M., C. Wiemann, N. Weber, M. Escher, A. Gloskovskii, W. Drube, M. Merkel, and C. M. Schneider.
Review of Scientific Instruments 85, no. 11 (2014): 113704.
[10.1063/1.4902141]

For the k-microscopy instrument please additionally reference to:
Breakthrough in HAXPES Performance Combining Full-Field k-Imaging with Time-of-Flight Recording
Medjanik, K., Babenkov, S. V. , Chernov, S., Vasilyev, D., Elmers, H. J.., Schoenhense, B., Schlueter, C., Gloskovskii, A., Matveyev, Y., Drube, W., Schönhense, G.
ArXiv:1810.11366 [Cond-Mat] (2018)
[http://arxiv.org/abs/1810.11366]