P08 - High Resolution Diffraction Beamline
P08 is specialized in X-ray scattering and diffraction experiments on solids and liquids where extreme high resolution in reciprocal space is required. The photon energy can be varied between 5.4 keV and 29.4 keV, the beamsize between 2 µm and 1 mm. The flux at the sample depends on the setup and is between 1010 and 1012 photons/sec. The resolution in reciprocal space at 8 keV corresponds to smallest lenghtscales of 80 pm with an accuracy of 5x10-5 and 5 µm for upper lengthscales. At 25 keV length scales between 30 pm with 10-4 accuracy and 1.5 µm are accessible.
CONTACT |
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GENERAL SPECIFICATIONS
techniques available
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High resolution X-ray scattering and diffraction
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photon source
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undulator
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period
number of periods
max power
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29 mm
66
3 kW
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source brilliance
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10 18 ph /s / 0.1% bw / mA (max. 100mA)
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polarization available
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linear horizontal
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energy range
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5.4 keV – 29.4 keV
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beamline energy resolution
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deltaE/E = 0.6x10-4 ... 0.1x10-4
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max flux ON SAMPLE
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2x1012 ph/s at 8.4 keV
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spot size ON SAMPLE
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30 μm x 2 μm to 1500 μm x 1000 μm
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angle of incidence light – sample
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0° to 90° (solid) / 2.5 Å-1 (liquid)
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sample type
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solid or liquid
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OPTICS
type |
liq. N2 cooled Double Crystal Monochromator |
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available reflections |
Si111 and Si311
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energy range |
4.5 keV - 70 keV
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resolving power |
E/deltaE : 1x104 ... 2x104
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type |
Compound Refractive Lens changer 1 |
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focal length |
ca 30 m
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type of lenses |
2d - Beryllium
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energy range |
5.4 keV - 29.4 keV
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usage |
1) Setting to arbitrary beamsize
200µm - 1500µm (horizontally)
20µm - 1000µm (vertically)
2) collimation
horizontal divergence : 10µrad
vertical divergence : 2µrad
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type |
Large Offset Double Crystal Monochromator |
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available reflections |
Si311 and Si511
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energy range |
5.4 keV - 18.4 keV (Si311)
8.4 keV - 29.4 keV (Si511)
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resolving power |
E/deltaE = 1.6x104... x105
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type |
Compound Refractive Lens Changer 2 |
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focal length | 2 m |
type of lenses
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2d - Beryllium
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energy range
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5.4 keV - 29.4 keV
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usage
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microfocussing:
30µm (horizontally)
2µm (vertically)
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ENDSTATION(S)
Diffractometer
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6-Cirlce Kohzu NZD-3, closed Eulerian Cradle
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Manipulator |
Standard stage (10 kg max load):
xy : +/- 15 mm travel ; z : +/- 10 mm travel
distance to pivot point: 70-90 mm
optional: double goniometer for surface alignment
(18-38 mm til pivot point)
Optional: Heavy load stage (20 kg max load, opposite to
standard sage, 80 mm hole through
xyz : +/- 5 mm travel
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Sample environment |
optional : HV oven with Be-dome for thin layers (500°C)
optional : Anton Paar vacuum oven (Carbon-dome) for thin layers (1000°C)
optional : Kapton cell flushed with inert gas
optional : two microscops (2µm resolution) from top and/or
from the side optional : Lakeshore 340 temperature controller optional : user defined equipment |
Diffractometer
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Special Diffractormeter for Liquid Surfaces
and Interfaces (LISA)
Type: Double Crystal (Si111 / Si220)
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Manipulator |
xyz - stage (80 kg max load)
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Sample environment |
optional : anti-vibration stage
optional : Lakeshore 340 temperature controller optional : user defined equipment |
DETECTOR(S)
Transmission
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yes
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Refraction
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yes
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Fluorescence
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partially
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Total electron yield
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no
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Grazing incidence angle
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yes
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Type
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APD, NaI
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energy resolution
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none
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count rate
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107 cts/s (APD) ; 4x104 cts/s (NaI)
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angular resolution
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given by slits
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2theta range
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Scanning : Depending on setup -10° ... 80° / 140°
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2theta horizontal range
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Scanning : Depending on setup -10° ... 45°
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typical collection time
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1 ms ... 10 s
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Type
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Vortex
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energy resolution
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100 eV |
count rate
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2x105 cts/s
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2theta range
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fixed to backscattering
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typical collection time
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1 s
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Type
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Dectris Mythen 1k
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energy resolution
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none |
count rate
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105 cts/s/pixel
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spatial resolution
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50 µm
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angular resolution
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0.002°/pixel |
2theta range
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Scanning : depending on setup : -10° ... 80°/140°
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2theta horizontal range
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Scanning : depending on setup : -10° ... 45° |
read-out time
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100 ms (standard)
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pixel size
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50 µm x 8000 µm |
array size
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1 x 1280 |
field of view
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8 x 64 mm2
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degrees of freedom / translation stages
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1 rotation hor/ver |
typical collection time
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0.1 ... 10 s
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Type
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Perkin Elmer XRD 1621 (flat panel)
|
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count rate
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65 kcts/pixel
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spatial resolution
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200 µm
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angular resolution
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depending on setup |
2theta range
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depending on setup : 4°...40°
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read-out time
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15 frames/sec
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pixel size
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200 µm x 200 µm |
array size
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2048 x 2048 |
field of view
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410x 410 mm2
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degrees of freedom / translation stages
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no |
typical collection time
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0.1 ... 100 s
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Type
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Dectris Pilatus 100 K
|
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count rate
|
1 Mcts/pixel/sec
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spatial resolution
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172 µm
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angular resolution
|
depending on setup |
2theta range
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Scanning : depending on setup : -10°...80°/140°
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2theta horizontal range
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Scanning : depending on setup : -10°...45° |
read-out time
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1 msec
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pixel size
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172 µm x 172 µm |
array size
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487 x 195 |
field of view
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83.8 x 33.5 mm2
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degrees of freedom / translation stages
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no |
typical collection time
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2 ms ... 10 sec
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CONTROL/DATA ANALYSIS
Software type
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SPOCK, Tango
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Data output type
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ascii, cbf, tif, Online format fio |
Data output
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ascii, TIF
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Software(s) for quantitative analysis
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Python based scripts, Matlab, fit2d |
SUPPORT LAB
On request two support labs are available for mechnical and electronic work. An optical microscope for sample preparation can also be used.