PHOTON SCIENCE

P02.2 - Extreme Conditions Beamline

PETRA III is one of the foremost 3^rd generation synchrotron facilities in the world due to its low emittance storage ring that creates a very small and highly brilliant source. Such a source is ideally suited for experiments at extreme conditions of high-pressure and simultaneous high/low pressures since they require hard x-rays with high brilliance and a small focus. Beamline P02.2 is designed to meet these needs by providing a experimental stations for hard x-ray diffraction studies at extremes. The Extreme Conditions Beamline (ECB) is optimized for micro powder and single crystal diffraction as well as scattering on non-crystalline materials at simultaneous high pressure and high/low temperatures in the Diamond Anvil Cell and the Paris Edinburgh Press. The ability to create extreme conditions is complemented by time resolved diffraction capabilities at the hundreds of micro seconds in order to explore the kinetics of physical processes such as meta-stabilities during a phase transition.

CONTACT

Hanns-Peter Liermann Beamline Manager P02.2

GENERAL SPECIFICATIONS

techniques available	X-ray diffraction (single crystals, powders and non-crystalline materials)
photon source	Undulator U23, 2 m long
period number of periods max power	23 mm; source size: 140 (H) x 5.6 (V) µm2, divergence: 7.9 (H )x 4.1 (V) µrad2 1.7 kW
source brilliance	1019 ph / s / 0.1% bw / mA
polarization available	linear horizontal
energy range	8.6-100 keV, currently fixed to 25.7, 42.9 and 60 keV
beamline energy resolution	Si (111) and (311), ΔE/E = 1 x 10-4 / 5 x 10-5
max flux ON SAMPLE	~1·1012 ph/s at 25.6 keV (KB Mirror Focusing)
spot size ON SAMPLE	2 (H) x 2 (V) µm2 (KB mirror focusing) at 25.6 & 42.7 keV, 7 (H) x 2 (V) µm2 (CRL focusing) at 25.6 & 42.7 keV, sub-micron focus (ca. 0.75 x 0.75 µm2) at 25.6 keV
angle of incidence light – sample	0 to 90
sample type	solid or liquid

 

OPTICS

type	(mirror, grating (plane, spherical, etc.), crystal monochromator, etc):
grating properties	double crystal monochromator Si (111) and Si (311), KB mirrors and CRL focusing
energy range	8.6-100 keV, currently fixed to 25.7, 42.9 and 60 keV
resolving power	Si (111) and (311), Δ E/E = 1 x 10-4/ 5 x 10-5

 

ENDSTATION(S)

Sample positioning

Diffractometer	1 circle goniometer
Manipulator	6 degrees of freedom (Cenx, Ceny, Omega, SamX, SamY, SamZ) at room temperature Transfer system Remote computer control
Sample environment	Temperature range: 25-5000 K, pressure range: 1 bar - 10 Mbar

Sample environment

pressure range	1-10 Mbar in the DAC (user supplied DAC only)
temperature range	15-300 K (He flow cryostat), 300-750 K (wire resistive heated DAC, user supplied only), 300-1500 K (graphite resistive heated DAC, user supplied DAC only), 1200-5000 K (double sided Yb-fiber laser & one sided CO2 h  heated DAC (under commissioning)), DACs can be provided by the beamlines but diamonds user supplied, Paris Edinburgh Press.
humidity range	n.a.

Detection modes

Transmission	Perkin Elmer XRD 1621 (CsI bonded amorphous silicon detector), 2 x 2.3 MPix GaAs LAMBDA , Pilatus 300 k and 1 M (Pilatus only on demand for pump and probe experiments from the detector pool)
Reflection	n.a.
Fluorescence	silicon drift detector
Total electron yield	n.a.
Grazing incidence angle	n.a.

Detectors

Type	PerkinElmer XRD 1621
energy resolution	none
count rate	max. 63000 counts/sec
spatial resolution	point spread function of 1.1 pixels
angular resolution
2theta range	max Q = 18 Å-1 at SDD of 350 mm and 60 keV
read-out time	max. 15 Hz read-out frequency
pixel size	200 x 200 µm2
array size	2048 x 2048 pixels, 400 x 400 mm2
field of view	n. a.
degrees of freedom / translation stages	4 (parallel to beam, horizontal to beam, tilt and rotation)
cradles	rotation = +/- 30 degrees, tilt = +/- 2 degrees
typical collection time	depending on sample 0.067-360 sec, maximum 1 s exposure time per frame (longer collection times through accumulation)

Type	2D 2.3 Mpix GaAs LAMBDA
energy resolution	none
count rate	max. 200000 counts/pixel/s
spatial resolution	point spread function of 1 pixels
angular resolution
2theta range	max Q = 12 Angstrom-1 at SDD of 150 mm and 42.7 keV (off centre)
read-out time	max. 2 kHz read-out frequency (4 kHz when triggering both detectors 0.0025 s apart)
pixel size	55 x 55 µm2
array size	1536 x 1536 pixels, 84 x 84 mm2
field of view	n. a.
degrees of freedom / translation stages	2 (parallel to beam, horizontal to beam)
cradles	n.a.
typical collection time	depending on sample 0.005 - 360 sec

spectrometer(s) / microscope(s)

Imaging mode	reflection and transmission
type	online microscope
energy resolution	n. a.
lateral resolution	2 µm
field of view	0.2-1 mm (max only on general purpose experiment)

 

CONTROL/DATA ANALYSIS

Software type	Python (Perl)
Data output type	HDF5, Nexus, tiff, fio (data arranged in columns)
Data output	tiff, ascii, hkl
Software(s) for quantitative analysis	2d data: DIOPTAS, FIT2d, P02tool integrated / 1d data: CrysAlis(Pro), TOPAS, ...

 

SUPPORT LAB

P02.2 Lab => microscopes, EDM, mechanical micro drilling (for ceramics only)

Shared with P02.1 => Chemistry laboratory equipped with glove box (with microscope), muffle furnace (max. 1200°C), micro scale, fume hood

Shared with Sample Enviorment Group: Offline Ruby/Aligment, Offline Raman, Offline Laser Heating, Offline laser drilling, Gas Loader; FIB (partial access).