Unified Data Sheet

Beamline P01

P01 - Dynamics Beamline

GENERAL SPECIFICATIONS

techniques available

Nuclear resonant scattering

photon source

undulator

period

number of periods

max power

32 mm;

  2x157;

 5.5 kW

source brilliance 

1019 ph / s / 0.1% bw / mA

polarization available

linear horizontal

energy range 

2.5 keV – 80 keV 

beamline energy resolution

1 meV at 14.4 keV

max flux ON SAMPLE

7 *1013 ph /s at 14.4 keV

spot size ON SAMPLE 
3000x1000 μm2 to 4x7 μm2      

angle of incidence light – sample 

0 to 90

sample type

solid or liquid

 

OPTICS

type

  cryo cooled double crystal monochromator
properties 

Si (111) and Si (311)
energy range         

2.5 keV - 80 keV
resolving power  0.01% and 0.0015%

 

ENDSTATION(S)

Sample positioning

Diffractometer

n. of circles
Manipulator 

Degrees of freedom/translation stages (number), cradles (angles)

Temperature range

Transfer system (if applicable YES/NO)

Control (manual, computer)
Sample environment 

pressure range   100kPa to 100GPa (1 Bar to 1MBar)
temperature range  6 K to 800 K (Laser heating 3000 K)
humidity range       n.a.


Sample environment

pressure range

               100kPa to 100GPa (1 Bar to 1MBar)

temperature range

              2 K to 800 K (Laser heating 3000 K)

humidity range

              n.a.


Detection modes

Transmission 

             yes

Reflection   

              yes

Fluorescence           

              yes

Total electron yield

              no

Grazing incidence angle    

        > 0.1 deg


Detector(s)

Type 

 APD MYTHEN

MAR345

energy resolution 

 none 
none

none

count rate 

 10^7 Hz
  

   

spatial resolution 

 n.a. 50 µm  
100 µm

angular resolution  

 n.a.
n.a.    
n.a.

2theta range  

     1 to 5 deg

read-out time 

 5 ns
 0.3 ms 
1 min.

pixel size         

 1 cm 50 µm 
 100 µm

array size 

 n.a.  
1 x 1280 
n.a.

field of view  

 n.a. 
n.a.   n.a.

 degrees of freedom / translation stages

 n.a. n.a. 
n.a.

cradles

 n.a. n.a.
n.a.

  typical collection time

 n.a.
  n.a.
n.a.


spectrometer(s) / microscope(s)

Imaging mode  

transmission, emission, absorption, phase contrast, darkfield…

type

e.g. photoelectron analyzer, peem microscope

energy resolution

  

lateral resolution

  

field of view

min-max

 

other facilities available: AFM,  in-situ sputter chamber, IR spectrometer

 

CONTROL/DATA ANALYSIs

Software type

spock, TANGO, python, perl

Data output type

.fio, hdf5, spectra, images

Data output

ascii, ???

Software(s) for quantitative analysis

 CONUSS, MOTIF, IDOS, PHOENIX

 

SUPPORT LAB

list 1000 Char