P21.1 - Broad band high-energy Diffraction
P21.1 is specialized in X-ray scattering and diffraction experiments on solids and liquids using high-energy x-rays. At the beamline experiments have been done for a wide range of materials ranging from single crystals to nanocrystalline powders and liquids.
GENERAL SPECIFICATIONS
|
techniques available
|
X-ray diffraction X-ray total scattering
|
|---|---|
|
photon source
|
undulator
|
|
period
number of periods
max power
|
29 mm
66
3 kW
|
|
source brilliance
|
10 18 ph /s / 0.1% bw / mm2 (max. 100mA)
|
|
polarization available
|
linear horizontal
|
|
energy range
|
discrete fixed energies: 52, 85, 100 keV
|
|
beamline energy resolution
|
100eV at 100keV
|
|
max flux ON SAMPLE
|
2x1011 ph/s at 100 keV (calculated)
|
|
spot size ON SAMPLE
|
1mm × 1mm
|
|
angle of incidence light – sample
|
0-90°
|
|
sample type
|
solid or liquid
|
OPTICS
|
type |
water cooled single bounce monochromator in horizontal Laue scattering geometry |
|---|---|
| available reflections |
Si(111), Si(220) and Si(311)
|
| energy range |
discrete fixed energies: 52, 85, 100 keV
|
| resolving power |
E⁄ΔE : 1×103
|
ENDSTATION(S)
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Diffractometer
|
Diffractometer in EH1: Heavy load diffractometer & optional closed
Eulerian cradle
|
|---|---|
| Sample Environments |
10-350 K closed cycle displex cryostat, 10
Tesla magnet with He-4 VTI, |
DETECTOR(S)
|
Transmission
|
yes
|
|---|---|
|
Refraction
|
no
|
|
Fluorescence
|
no
|
|
Total electron yield
|
no
|
|
Grazing incidence angle
|
no
|
|
Type
|
Amptek CdTe-Diode
|
|---|---|
|
energy resolution
|
<2%
|
|
count rate
|
5*104 cts/s
|
|
angular resolution
|
given by slits
|
|
2theta range
|
-10° ... 35° (hor)
-10° ... 10° (ver)
|
|
Field of View
|
max. 5 × 5 mm2 |
|
degrees of freedom / translation stages
|
rotation, translation |
|
typical collection time
|
0.1 - 20 s
|
|
Type
|
Perkin Elmer XRD1621 (flat panel)
|
|---|---|
|
pixel size
|
200 µm × 200 µm |
|
array size
|
2048 × 2048 |
|
field of view
|
410 × 410 mm2
|
|
degrees of freedom / translation stages
|
rotation, translation |
|
typical collection time
|
0.1s - 8 s
|
|
Type
|
Varex XRD4343CT
|
|---|---|
|
pixel size
|
150 µm × 150 µm |
|
array size
|
2880 × 2880 |
|
field of view
|
430 × 430 mm2
|
|
degrees of freedom / translation stages
|
rotation, translation |
|
typical collection time
|
0.1s - 8 s
|
|
Type
|
Pilatus3 X CdTe 2M (from pool request if necessary)
|
|---|---|
|
pixel size
|
172 µm × 172 µm |
|
array size
|
1475 × 1679 |
|
field of view
|
253 × 288 mm2 (with gaps)
|
|
degrees of freedom / translation stages
|
rotation, translation |
|
typical collection time
|
0.002 - 60 s
|
| Type |
Pilatus3 X CdTe 100 |
|---|---|
| read out time | 0.95 ms |
| pixel size | 172 × 172 µm2 |
| array size | 487 × 195 |
| field of view | 83.8 × 33.5 mm2 |
| degrees of freedom / translation stages | rotation, translation |
| typical collection time | 0.002 - 60 s |
Further detectors are available from the PETRA detector pool.
CONTROL/DATA ANALYSIS
|
Software type
|
Spock, Taurus, Python
|
|---|---|
|
Data output type
|
Diffraction patterns, images, parameters such as temp., press, etc.
|
|
Data output
|
ascii, TIF
|
|
Software(s) for quantitative analysis
|
commercial/in-house
|
SUPPORT LAB
On request support labs are available for mechanical, electronic and basic chemial work. An optical microscope for sample preparation is available.
Access to a chemistry lab can be arrange upon request as well as use of instruments for further sample analysis (via VIA).
