Unified Data Sheet

P24 - Chemical Crystallography

P24 is dedicated to crystallographic studies in fields like physics, chemistry, biology, earth and material sciences. The beamline provides monochromatic X-ray beam in a range from 8 KeV until 44 KeV. Typical applications: classical crystal structure, diffuse scattering, charge density analysis, phase transitions, disordered and modulated structures at different sample environments (temperature, pressure, electric and magnetic fields etc). It consists of one control room, two experimental hutches and a preparation laboratory equipped with a fume hood to handle toxic solvents. P24 provides powerful instrumentation for new applications and to continue the activities of the former experimental stations D3, F1 and B2 from DORIS III, shutdown on 2012 ...... .

CONTACT


GENERAL SPECIFICATIONS

techniques available

X ray Chemical Crystallography

photon source
U29 PETRA III undulator (2meters)
period
number of periods
max power

29 mm
66 periods
3 Kw (max power)

source brilliance 
10 18 ph /s / 0.1% bw / mA    (max. 100mA)
polarization available
linear horizontal
energy range 


       8 keV, 17KeV - 44 keV

beamline energy resolution


       ΔE/E = 1.4 x 10-4 resp. 0.6 x 10-4

max flux ON SAMPLE

5x1011 ph/s at 8 keV

1012 ph/s at 22 keV

spot size ON SAMPLE 

400 μm x 400 μm

sample type


       single crystals

 

OPTICS

type

  Water cooled Double Crystal Monochromator

available reflections
Si111  and  Si311
energy range         
  8 keV: 17 - 44 keV
resolving power 

E/ ΔE : 1x104 ... 2x104


        



       ENDSTATIONS (P24.2 and P24.3)


P24.2 X ray Diffraction

Diffractometer

Four circle kappa diffractometer

Beam height over rail 

1422 mm

Sample environment 

Gas jet cryostat

P24.3 X ray Diffraction

Diffractometer

Four circle diffractometer with Euler cradle

Beam height over rail 

1422 mm

Sample environment 

Gas jet cryostat or closed cycle displex cryostat

Beam height

1422 mm

Sample
environment
 

Vacuum
user-defined equipment

DETECTORS

Detection modes
Diffraction 

yes

Fluorescence           

yes

Transmission 

no

Refraction   

no

Grazing incidence angle    

no



Fluorescence Detector
Type 
Amptek Silicon Drift SDD
energy resolution 

125 – 135 eV FWHM at 5.9 keV 

count rate 


       105 Hz  

Scintillation Detector
Type 
Cyberstar 48mm body, 30mm aperture, 5mm LaCl3 scintillator, Be window
energy resolution 

25 % at 22 KeV 

count rate 


       2.5 Mcps 

2D Detector
Type 
MARCCD 165
  typical collection time

>0.1 s

 

CONTROL/DATA ANALYSIS

Software type

online, spec

Data output type


       diffraction data

Data output


       ASCII, NEXUS, TIFF

Software(s) for quantitative analysis


Eval14
Eval15
XDS
CrysAlis
CCP4


        



       Sample preparation lab



       A sample preparation lab with fume hood is adjacent to the control hutch.