Unified Data Sheet

P22 - Hard X-ray Photoelectron Spectroscopy

P22 is designed for X-ray photoelectron spectrospopy techniques and applications making use of the high source brilliance in the photon energy 2.4 - 15 keV.

CONTACT

General Specifications

 

Techniques available

HAXPES
HAXPEEM
Ambient pressure HAXPES

Photon source

2m spectroscopy undulator

Period
Number of periods
Max total power

32.8 mm
58
3.5 kW

Source brilliance

10 18 ph /s / 0.1% bw / 100 mA

Polarisation

linear horizontal

Photon Energy range

2.4 keV - 30 keV

Beamline energy resolution

deltaE/E = 1.4 x 10-4 resp. 0.6 x 10-4

Max flux on sample

2x1013 ph/s at 6 keV (Si (111) bandpass)

Minimum spot size on sample

10 x 10 um2

Sample type

preferrably conducting


 

Optics

 

Primary monochromator

 

Type

LN2 cooled Double Crystal

Energy range

2.4 - 30 keV

Resolving power

ΔE/E : 1.3x10-4 - 0.28x10-4

Available reflections

Si(111), Si(311)

Secondary monochromator

 

Type

Double channel-cut (+ - - +)

Energy range

2.4 - 15 keV

Resolving power

ΔE/E : 10-4 - 5x10-6

Available reflections

Si(333), Si(444), Si(220)

Phase retarder

 

Type

single stage
single crystal diamond

Energy range

4 - 10 keV

Mirror 1

 

Shape

Cylinder, deflecting horizontal

Coatings

B4C / Palladium

Energy Range

2.4-11 keV (B4C)
5-20 keV (Pd)

Usage

Vertical focusing

Mirror 2

 

Shape

Plane, deflecting horizontal

Coatings

B4C / Palladium

Energy range

2.4-11 keV (B4C)
5-20 keV (Pd)

Usage

Beam deflection

Mirror 3

 

Shape

Plane elliptical (mirror bender)

Coatings

B4C / Palladium

Energy range

2.4-11 keV (B4C)
5-20 keV (Pd)

Usage

Horizontal focusing