Unified Data Sheet

P09 - Resonant Scattering and Diffraction (RSD) Beamline - Hard X-Ray Photoelectron Spectroscopy (HAXPES)

P09 is dedicated to scattering and diffraction experiments in the hard x-ray range using variable incident polarization. The photon energy can be varied between 2.7 keV and 24 keV (EH1) or 32 keV (EH2). Beam sizes are between 4 µm and 1 mm. Experiments as function of temperature and magnetic or electric fields can be conducted. The scattered polarization is analyzed by a polarization analyzer. Hard X-ray Photoemission Spectroscopy experiments can be conducted in EH3 using variable incident polarization.


techniques available Resonant and non resonant elastic scattering
photon source undulator
number of periods
max power
31.4 mm
9.5 kW
source brilliance  1018 ph / s / 0.1% bw / mA
polarization available variable linear / circular
energy range  2.7keV – 50 keV 
beamline energy resolution 1.3x10-4(111) / 0.28x10-4(311)
max flux on sample 2x1013 ph /s at 8 keV
spot size on sample
50 μm x 4 μm  to  2000 μm x 1500 μm      
angle of incidence light on sample 0° to 70°
sample type single crystal



liquid N2 cooled Double Crystal  Monochromator

Available reflections Si111 and Si3111
energy range          2.7 keV - 50 keV
resolving power 7700 - 35000


Double phase retarder
polarization variable linear / circular
energy range 3.3 keV to 8.5 keV


Double mirror

coating quartz / Pd coating
energy range 2.7 keV - 24 (32) keV
usage higher harmonic suppression:
        5.7 keV, 11.5 keV and 24 keV (EH1)
        7.3 keV, 14.3 keV and 31 keV (EH2)
        150 µm x 30 µm


Compound refractive lens changer

focal length 1.9 m +/- 0.15 m
 type of lenses
2D - Beryllium
energy range 2.7 keV to 24 keV
 usage microfocusing:
       50 µm (horizontally)
         4 µm (vertically)


High precision diffractiometer
Diffractometer 6-Circle Huber, open Eulerian cradle
Manipulator max 15 kg load
xy: +/- 5 mm travel; z: +/- 3 mm travel
temperature range: 1.7 K - 800 K
Sample environment
optional: ARS 1.7 - 300 K Displex cryostat
optional: ARS 4 - 450 K Displex cryostat
optional: ARS 6 - 800 K Displex cryostat
optional: Anton Paar vacuum oven (Carbon-dome) for thin layers (1000°C)
optional: user defined equipment
Detectors Polarization analyzer
2D - detector
Heavy load diffractometer
Diffractometer Horizontal Psi-diffractometer
Manipulator max 650 kg load
xy: +/- 5 mm travel; z: +/- 10 mm travel
Sample environment
optional: 14 T magnet (2 - 300 K)
optional: 14 T magnet with He3-insert (300 mK -300 K)
optional: user defined equipment
Detectors Polarization analyzer
2D - detector


Point Detector(s)
Type  APD, NaI
energy resolution ~ 20 %
count rate 107 cts/s (APD)
4x104 cts/s (NaI)
angular resolution    given by slits
2theta range     Scanning: -20° ... 160°
2theta horizontal range   Scanning: -20° ... 160°
cradles analyzer / polarization analyzer
typical collection time 0.1 s ... 30 s
Point Detector(s)
Type  Vortex
energy resolution 100 eV
count rate  2x105 cts/s
2theta range
fixed 90 degrees
typical collection time 1 s
Area Detector(s)
Type  Pilatus 300k
energy resolution  none
count rate  105 cts/s/pixel
spatial resolution  172 µm
angular resolution   0.05° - 0.005°/pixel
2theta range   Scanning: -20° ... 135°
read-out time  2.6 ms
pixel size          172 µm x 172 µm
array size  487 x 619 pixels
field of view  

83.8 x 106.5 mm2

degrees of freedom / translation stages 400 mm linear translation (motorized)
400 mm linear translation (manual)
cradles 2theta arm (horizontal/vertical)
typical collection time 1 - 100 Hz

type photoelectron analyzer
energy resolution  
lateral resolution  
field of view  


other facilities available: sample preparation, optical microsope


Software type Tango, Online, Spectra, Matlab
Data output type ascii: fio-format
Pilatus: cbf-format
Data output ascii, cbf
Software for quantitative analysis in-house: Diffit, Matlab


Sample Preparation Laboratory
Chemistry Laboratory