High Resolution Powder Diffraction Beamline P02.1

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Schematic of the optical train
U         undulator U23
L1,L2   Laue monochromator crystals, C(111) and Si(111)
S1,S2  slit systems
Sp       sample, e.g. powder in capillary
D1,D2 detectors, e.g. multi-analyser, flat panel

Overview of the experimental setup of P02.1

High resolution diffractometer


The High Resolution Powder Diffraction beamline P02.1 is part of the Hard X-Ray Diffraction beamline P02. It operates at a fixed energy of 60 keV (corresponding to 0.207 Å) and exhibits low divergence, small energy bandwidth, and high flux. The photon energy of 60 keV is particular useful for the characterization of nanocrystalline and disordered materials through the combination of high angular resolution capabilities as well as access to large q-space. Thus, total scattering experiments that evaluate data in real and reciprocal space are predestined for P02.1. In addition, the high photon flux enables time resolved studies with resolution down to the (sub) second regime. As a result, structural and chemical transformations in this time regime can be effectively studied. The experimental setup includes several standard sample environments for heating and cooling as well as the capability to mount diverse sample holders, reaction cells, and other user-specific sample environments.



  • dedicated high energy undulator
  • dispersive high resolution double crystal Laue monochromator with diamond
    (111) and silicon (111) crystals
  • fixed energy 60 keV (0.207 Å)
  • long-term stability within +- 2% intensity fluctuation over several days
  • focusing capability (compound refractive lenses) planned for end of 2018


  • 3-axes goniometer with concentric circles
  • vertical scattering geometry
  • two plates for high resolution detector and ultra-fast microstrip detector (on-going development)
  • mechanical resolution 2.5 × 10-5 deg
  • load capacity 50 kg (sample) and 80 kg (detectors)
  • manufactured by Rotary Precision Instruments (RPI)
  • funded and developed in collaboration with German Federal Ministry of Education and Research (BMBF) project group PI H. Ehrenberg 



High resolution detector
  •  Si (111) analyser crystals in Bragg geometry
  • 10 channels
  • funded and developed by German Federal Ministry for Education and Research (BMBF) project group PI H. Ehrenberg
Fast area detector PerkinElmer XRD1621 
  • amorphous Si sensor with CsI scintillator
  • 40 × 40 cm2 active area
  • 2048 × 2048 pixels, 200 µm2 size
  • readout up to 15 Hz (full resolution) and 30 Hz (binned)
  • 16 bit resolution
Very fast microstrip detector
  • MYTHEN type architecture
  • high-Z material, e.g. Ge, CdTe
  • coverage of 60 °2θ
  • under development by DESY and other light sources


Standard sample environments

  • sample spinning
  • high temperatures, e.g. hot air blower, Linkam furnace
  • low temperatures, e.g. cryo streamer
  • automatic sample changing for capillaries (installation in 2018)
  • flat sample holder for measurements in transmission (e.g. pellets, ribbons) and reflection (e.g. thin films)

Please visit the webpage of the Sample Environment and Extreme Conditions Science Infrastructure (ECSI) for more details.

Current status

  • high resolution diffractometer and 2D detector support tracks installed in July/August 2012
  • medium resolution measurements using area detector, available sample to detector distance 200 to 2875 mm
  • accessible real space approx. 25 Å-1
  • temporary sample environment table