Extreme Conditions Beamline (ECB) P02.2

  • Fixed Energy @ 25.7, 42.8, and 60 keV
  • Sample Stack with ~100 nm precision
  • Omega Rotation with less than 1 µm spherical confusion
  • Area Detectors in forward geometry (PerkinElmer, GaAs Lambda)
  • Focusing with KB mirror and CRL lens systems
  • Double-side laser heating (on axis & off axis) with two NIR fiber lasers (1070 nm)
  • Single sided laser heating (off axis) with CO2 laser (10000 nm)
  • Double-side temperature measurements
  • Sample inspection
  • Online ruby fluorescence
  • Fixed Energy @ 25.7, 42.8, and 60 keV
  • Sample Stack with ~100 nm precision
  • Omega Rotation with less than 1 µm spherical confusion
  • Area Detectors in forward geometry (PerkinElmer, GaAs Lambda)
  • Focusing with KB mirror and CRL lens systems
  • Resistive heated DACs
  • Cryogenically cooled DACs
  • 2 cricle single crystal diffractometer with double sided CW laser heating (ongoing development)
  • 4 circle single crystal diffractometer (future development)
  • Sample inspection
  • Online ruby fluorescence

Beam profiles (measured and differentiated) of 7 (H) x 2 (V) µm2 using 42 Compound Refractive Lenses (CRL) each with radius of curvature of 50 µm and an acceptance of 400 µm, located at 1.2 m from the sample position. Flux in the focal spot is about 1011 ph/sec resulting in a flux density of ca. 2 x 1015 ph/sec/mm2. Further optimisation of the focal spot by varying the focal distance will be necessary to reach the predicted parameters of 5 (H) x 1 (V) µm2.


Focal spot size after the KB mirror system.
Beam Energy = 25.7 keV (42.7 keV)
Grazing Incident Angle = 2 mrad (1.5 mrad)
Entrance Aperture = 5602 µm2 (4202 µm2)
Net reflectivity = 70%

Aim of the Extreme Conditions Beamline (P02.2, Part of the "Hard X-ray Diffraction Beamline" P02) is to provide tools for studying materials at extreme sample environments of high-pressure and high- and low-tempertures, with a strong emphasis on the Time Resolved Capabilities to promote diffraction work on dynamic phenomena at extremes.

Experimental Setup

Focusing, Beam Size Characteristics

X-ray Micro-Diffraction Techniques for high-P & high/low-T experiments

Monochromatic X-ray Diffraction Techniques

  • Powder Diffraction
  • Single-Crystal Diffraction
  • Amorphous Diffraction (PDF Studies)
  • Radial Diffraction for Texture Analysis

Fluorescence Spectroscopy at High Energy

  • Fluorescence with Micro-capillary
  • Laser-heating and Fluorescence

Pink Beam X-ray Diffraction Techniques

  • Powder Diffraction (under development)
  • Single Crystal Diffraction (under development)

Sample Environments

Sample Environments to Conduct Static Pressure Experiments

  • High-pressure in the DAC (powder & singel crystal diffraction)
  • High-pressure and -temperatures with double sided CW laser heating (powders diffraction only)
  • High-pressure and -temperatures with one sided CO2 laser heating (powder diffraction only)
  • High-pressure and -temperatures with resistive heated DACs (owder & singel crystal diffraction)
  • High-pressure and -temperatures with Paris Edinburgh cell (future development)
  • High-pressure and low temperature with the DAC in the helium flow cryostat (powder & singel crystal diffraction)

Sample Environments for Dynamic Experiments (powder diffraction only)

  • Time-resolved high-pressure studies in the membrane-DAC and the dDAC
  • Time-resolved high-pressure and CW laser-heated DAC
  • Time-resolved high-pressure and pulsed/flash laser heated DAC